A precision instrument for I-V characterization

The tightly-coupled nature of a SourceMeter instrument provides many advantages over separate instruments. The ability to fit a source and a meter in a single half-rack enclosure saves valuable rack space and simplifies the remote programming interface.

Highlights

• A precision instrument used for I-V characterization on a wide variety of devices and materials

• An SMU can source current or source voltage

• An SMU can measure both current and voltage

Greatly accelerate throughput with built-in voltage/current sweep capabilities

SourceMeter instruments provide sweep solutions that greatly accelerate testing with automation hooks for additional throughput improvement. This is true whether you are performing sweeps on transistors, simply verifying connector integrity, characterizing device performance, or virtually any DC volt-amp characteristic with high precision.

Highlights

• Linear staircase sweeps

• Logarithmic staircase sweeps

• Custom Sweeps

Integrate with switching systems for fast, multipoint testing

The instruments in the SourceMeter family offer wide versatility, so they make great solutions for a variety of applications in many industries. For seamless integration in fast multipoint testing applications, combine a SourceMeter instrument with a Keithley switch system.

Highlights

• Test semiconductor devices

• Test circuit Protection devices

• Test optoelectronic components

• Use for accelerated stress testing