
Keithley 4200A-SCS Parameter Analyzer
Brand :
Keithley
Categories :
Parameter Analyzer
, Semiconductor Test Systems
Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
Specifications
Parametric insight, fast and clear.
Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.
Highlights
Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
Automated real-time parameter extraction, data graphing, analysis functions
Accurate C-V Characterization
Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
Highlights
First C-V meter in its class capable of driving a 1 V AC source voltage
1 kHz frequency resolution from 1 kHz to 10 MHz
Measure capacitance, conductance, and admittance
Measure on up to four channels with the 4200A-CVIV Multiswitch
Measure. Switch. Repeat.
The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
Highlights
Move C-V measurement to any device terminal without re-cabling
User-configurable for low current capability
Personalize the names of output channels
View real-time test status
Stable low current measurements for I-V Characterization
With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.
Highlights
Add an SMU without sending the instrument back to the factory
Make femptoamp measurements
Up to 9 SMU channels
Optimized for long cables or large chucks
Integrated solution with analytical probers and cryogenic controllers
The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.
Highlights
"Point and click" test sequencing
"Manual" prober mode tests prober functionality
Fake prober mode enables debugging without removing commands
Model | Description |
---|---|
4200A-SCS-PKA High Resolution IV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 8101-PIV: One test fixture with sample devices |
4200A-SCS-PKB High Resolution IV & CV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
4200A-SCS-PKC High Power IV & CV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4211-SMU: Two high power SMUs for high capacitance setups 4200-PA: Two preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
4200-BTI-A Ultra-fast NBTI/PBTI | For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
|
Model | Description |
---|---|
4200A-SCS-PKA High Resolution IV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 8101-PIV: One test fixture with sample devices |
4200A-SCS-PKB High Resolution IV & CV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
4200A-SCS-PKC High Power IV & CV | 4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4211-SMU: Two high power SMUs for high capacitance setups 4200-PA: Two preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
4200-BTI-A Ultra-fast NBTI/PBTI | For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
|