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Keithley 4200A-SCS Parameter Analyzer

Brand : Keithley
Categories : Parameter Analyzer , Semiconductor Test Systems

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

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Specifications

Parametric insight, fast and clear.

Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.

Highlights

  • Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types

  • Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software

  • Automated real-time parameter extraction, data graphing, analysis functions

Accurate C-V Characterization

Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.

Highlights

  • First C-V meter in its class capable of driving a 1 V AC source voltage

  • 1 kHz frequency resolution from 1 kHz to 10 MHz

  • Measure capacitance, conductance, and admittance

  • Measure on up to four channels with the 4200A-CVIV Multiswitch

Measure. Switch. Repeat.

The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

Highlights

  • Move C-V measurement to any device terminal without re-cabling

  • User-configurable for low current capability

  • Personalize the names of output channels

  • View real-time test status

Stable low current measurements for I-V Characterization

With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.

Highlights

  • Add an SMU without sending the instrument back to the factory

  • Make femptoamp measurements

  • Up to 9 SMU channels

  • Optimized for long cables or large chucks

Integrated solution with analytical probers and cryogenic controllers

The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

Highlights

  • "Point and click" test sequencing

  • "Manual" prober mode tests prober functionality

  • Fake prober mode enables debugging without removing commands

ModelDescription
4200A-SCS-PKA
High Resolution IV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
8101-PIV: One test fixture with sample devices
4200A-SCS-PKB
High Resolution IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200A-SCS-PKC
High Power IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4211-SMU: Two high power SMUs for high capacitance setups
4200-PA: Two preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200-BTI-A
Ultra-fast NBTI/PBTI
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
  • (1) 4225-PMU Ultra-Fast I-V Module

  • (2) 4225-RPM Remote Preamplifier/Switch Modules

  • Automated Characterization Suite (ACS) Software

  • Ultra-Fast BTI Test Project Module

  • Cabling

ModelDescription
4200A-SCS-PKA
High Resolution IV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
8101-PIV: One test fixture with sample devices
4200A-SCS-PKB
High Resolution IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200A-SCS-PKC
High Power IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4211-SMU: Two high power SMUs for high capacitance setups
4200-PA: Two preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200-BTI-A
Ultra-fast NBTI/PBTI
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
  • (1) 4225-PMU Ultra-Fast I-V Module

  • (2) 4225-RPM Remote Preamplifier/Switch Modules

  • Automated Characterization Suite (ACS) Software

  • Ultra-Fast BTI Test Project Module

  • Cabling

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